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Features:
-Determines good or bad transistors, FET's, SCR's, or diodes.
-Patented limited-energy pulse circuit permits in-circuit testing in the presence of low shunt impedance's with complete safety for the device under test.
-Easy to operate panel eliminates the need to refer to a reference or operating manual-only three switches, no panel adjustments.
-Six position test switch makes it unnecessary to know the device terminal identification.
-A logarithmically scaled meter identifies leakage in both Silicon and Germanium devices.
- Front Panel socket for out-of -circuit transistor testing.